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Certification:
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UL, CE, C-Tick, BSMI, KCC, Microsoft WHQL, VCCI
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SSD ARK ID:
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80997
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SSD usage tag:
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Data center
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Market segment:
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Server
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Mean time between failures (MTBF):
Statistical model used to indicate product/mechanism reliability; expressed in hours and percentage of duty cycle. This number (in hours) does not indicate the mean time before failure for a single unit/mechanism.
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2000000 h
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Uncorrectable Bit Error Rate (UBER):
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< 1 per 10^17 bits read
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SSD temperature monitoring:
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Yes
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Enhanced Power Loss Data Protection technology:
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Yes
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End-to-End Data Protection:
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Yes
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PCI Express interface data lanes:
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x4
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Lithography:
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20 nm
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Write latency:
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20 µs
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Read latency:
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20 µs
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Random write (100% span):
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30000 IOPS
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Random read (100% span):
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320000 IOPS
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Random write (8KB):
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19000 IOPS
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Random read (8KB):
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180000 IOPS
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Random write (4KB):
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30000 IOPS
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Random read (4KB):
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320000 IOPS
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Write speed:
The speed at which a device can write data.
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550 MB/s
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Read speed:
The speed at which a device can read data.
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2100 MB/s
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Memory type:
Type of memory in the device e.g. DDR3, SRAM (Static RAM).
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MLC
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NVMe:
NVM Express (NVMe) or Non-Volatile Memory Host Controller Interface Specification (NVMHCIS) is an open logical device interface specification for accessing non-volatile storage media attached via a PCI Express (PCIe) bus. NVM Express, as a logical device interface, has been designed to capitalize on the low latency and internal parallelism of solid-state storage devices.
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Yes
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Interface:
Interface ports to connect pieces of equipment. USB (Universal Serial Bus) has become the most popular wired interface to connect peripherals. USB 2.0 supports speeds up to 480 Mbit/s (USB 1: 12 Mbit/s). The interface FireWire is also known as the IEEE 1394 standard. Enhanced IDE (EIDE)is sometimes referred to as Fast ATA, Fast IDE or ATA-2.
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PCI Express 3.0
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SSD form factor:
The size of the solid-state drive, given in inches
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2.5"
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SSD capacity:
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400 GB
